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[J. Kor. Phys. Soc] C. S. Yeo et al, "Hall Mobility Manipulation in TiO2-x Semiconductor Films by Hydrogen-ion Irradiation"
[Á¶È¸¼ö : 1781, Ä«Å×°í¸® : 2013, No : 57]
[Appl. Phys. Lett] H. Park et al , "Device performance and bias instability of Ta doped InZnO thin film transistor as a function of process pressure"
[Á¶È¸¼ö : 1636, Ä«Å×°í¸® : 2013, No : 56]
[J. Vac. Sci. Technol. B] B. Ahn, K. Ok, Jin-Seong Park, K. Chung, "Device instability of postannealed TiOx thin-film transistors under gate bias stresses"
[Á¶È¸¼ö : 1801, Ä«Å×°í¸® : 2013, No : 55]
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