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Jin-Seong Park, The annealing effect on properties of ZnO thin film transistors with Ti/Pt source-drain contact, J. Electroceram. 25, 145
[조회수 : 1236, 카테고리 : 2010, No : 25]
J. Jung, K. Son, K. Lee, J. Park, T. Kim, J. Kwon, K. Chung, Jin-Seong Park, B. Koo, and S. Lee, The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under b..
[조회수 : 1191, 카테고리 : 2010, No : 24]
S. Lim, J. Kim, D. Kim, C. Lee, Jin-Seong Park, and H. Kim, The effects of UV exposure on plasma-enhanced atomic layer deposition ZnO Thin Film Transistor, Electrochem. Solid-State. Lett. 13, H151
[조회수 : 1179, 카테고리 : 2010, No : 23]
J. Jeong, J. K. Jeong, Jin-Seong Park, Y. Mo, and Y. Hong, Meyer-Neldel Rule and Extraction of Density of States in Amorphous indium-Gallium-Zinc-Oxide Thin-Film Transistor by Considering Surface Band..
[조회수 : 1229, 카테고리 : 2010, No : 22]
S. Lim, J. Kim, D. Kim, S. Kwon, Jin-Seong Park, and H. Kim, Atomic Layer Deposition ZnO:N Thin Film Transsitor: The Effects of N concentration on the device properties, J. Electrochem. Soc. 157 H214
[조회수 : 1217, 카테고리 : 2010, No : 21]
J.Jeong, Y. Hong, J. K. Jeong, Jin-Seong Park, and Y. Mo, MOSFET-Like Behavior of a-InGaZnO Thin-Film Transistors with plasma-exposed source-drain bulk region, J. Display Tech. 5, 495
[조회수 : 1345, 카테고리 : 2009, No : 20]
C. Kim, S. Kim, J. Lee, Jin-Seong Park, S. Kim, J. Park, E. Lee, J. Lee, Y. Park, J. Kim, S. Shin, and U. Chung, Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors, Applied Physic..
[조회수 : 1434, 카테고리 : 2009, No : 19]
H. Shin, B. D. Ahn, K. Kim, Jin-Seong Park, H. J. Kim, The effect of thermal annealing sequence on amorphous InGaZnO thin film transistor with a plasma-treated souce-drain structure, Thin Solid Films ..
[조회수 : 1436, 카테고리 : 2009, No : 18]
D. Stryakhilev, Jin-Seong Park, J. Lee, T. Kim, Y. Pyo, D. Lee, E. Kim, D. Jin and Y. Mo, Electrical Instability of a-In-Ga-Zn-O TFTs Biased Below Accumulation Threshold, Electrochem. Solid-State. Let..
[조회수 : 1377, 카테고리 : 2009, No : 17]
J. Lee, Jin-Seong Park, Y. Pyo, D. Lee, E. Kim, D. Stryakhilev, T. Kim, D. Jin, and Y. Mo, The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide..
[조회수 : 1309, 카테고리 : 2009, No : 16]
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