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조회수 64
카테고리 2020
No 206
제목 1. [IEEE TRANSACTIONS ON ELECTRON DEVICES] Soft Recovery Process of Mechanically Degraded Flexible a-IGZO TFTs With Various Rolling Stresses and Defect Simulation Using TCAD Simulation
1. [IEEE TRANSACTIONS ON ELECTRON DEVICES] Soft Recovery Process of Mechanically Degraded Flexible a-IGZO TFTs With Various Rolling Stresses and Defect Simulation Using TCAD Simulation


Beom-Su Kim, Hyun-Jun Jeong, Ki-Lim Han, Won-Bum Lee, Yoon-Seo Kim, and Jin-Seong Park



첨부파일
Soft Recovery Process of Mechanically.pdf